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dc.contributor.advisorIndacochea, J. Ernestoen_US
dc.contributor.authorKupfer, Marcus E.en_US
dc.date.accessioned2013-10-24T20:40:09Z
dc.date.available2013-10-24T20:40:09Z
dc.date.created2013-08en_US
dc.date.issued2013-10-24
dc.date.submitted2013-08en_US
dc.identifier.urihttp://hdl.handle.net/10027/10170
dc.description.abstractThe optimization of process parameters for sealing the sealing of large-area photodetector glass packages using low-temperature indium seals has been investigated in this report. Small scale 2.54×2.54 cm samples were used for experiments in order to gain an understanding of how the processing parameters will effect the seal integrity when scaled up to larger sizes such as 22×22 cm. First, substrates of B33 borosilicate glass were used for seal fabrication to validate that sealing indium to glass was indeed feasible and to study the effects of processing parameters on the integrity of the seal. Second, seals were made using glass substrates which were coated in an 80 wt% Ni/20 wt% Cr alloy (Nichrome A) to investigate its merit as an intermediate bonding layer to glass. Helium leak testing of the seals conclude that hermetic seals can be made using B33 glass in either the uncoated or NiCr-coated condition. The samples were also characterized by means of a lap shear test to evaluate the effect the applied load, load duration, and fabrication temperature played on the robustness of the joint. It was seen that increasing the applied load over the range of 890 to 2225 N leads to an increase in seal strength when using B33 substrates. Increasing the process duration over the range of 10 seconds to 60 minutes resulted in an increase in seal strength. Increasing the processing temperature from room temperature to 80 ºC increase in seal strength. However, indium began to over-flow from the edges of the substrates at 55ºC. For Nichrome-coated samples, an average increase of 54% in seal strength was seen when the applied load was increased from 1180 to 1558 N. Increasing processing time and temperature did not appear to have any effect on the seal strength of nichrome-coated samples. Aging of nichrome samples did not alter the integrity or hermeticity of the seals. Also, aged nichrome-coated seals were evaluated using Energy-dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) to identify if any new phases were present as a result of sealing. Ien_US
dc.language.isoenen_US
dc.rightsen_US
dc.rightsCopyright 2013 Marcus E. Kupferen_US
dc.subjectindiumen_US
dc.subjectsealingen_US
dc.subjectindium sealingen_US
dc.subjectvacuumen_US
dc.subjectvacuum sealingen_US
dc.subjectnickleen_US
dc.subjectchromeen_US
dc.subjectnichromeen_US
dc.subjecthermeticen_US
dc.subjecthermeticityen_US
dc.subjectbondingen_US
dc.subjectphotodetectoren_US
dc.subjectmaterialsen_US
dc.subjectengineeringen_US
dc.subjectscienceen_US
dc.subjectpackaging, borosilicate glassen_US
dc.subjectB33en_US
dc.titleAnalysis of Low-Temperature Indium Seals for Hermetic Packaging of Large-Area Photodetectorsen_US
thesis.degree.departmentCivil and Materials Engineeringen_US
thesis.degree.disciplineMaterials Engineeringen_US
thesis.degree.grantorUniversity of Illinois at Chicagoen_US
thesis.degree.levelMastersen_US
thesis.degree.nameMS, Master of Scienceen_US
dc.type.genrethesisen_US
dc.contributor.committeeMemberMcNallan, Michaelen_US
dc.contributor.committeeMemberWagner, Roberten_US
dc.type.materialtexten_US


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