X-ray resonant magnetic scattering study of magnetization reversals in a nanoscale spin-valve array
Lee, Dong Ryeol
Freeland, John W.
PublisherAmerican Physical Society
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We present an x-ray resonant magnetic scattering study that uses the periodicity of a patterned array of trilayer (Co/Cu/NiFe) elements to determine not only layer-dependent magnetic hysteresis, but, more importantly, to extract the magnetization reversal in different sections of the picture-frame-shaped structure. Spatially resolved and layer-resolved magnetization measurements have revealed that magnetic switching mechanism is very distinct in different regions of the structure and results from a balancing of the shape anisotropy and strong interlayer dipolar coupling. These results demonstrate how spatially averaged measurements are not sufficient to resolve the nature of the reversal mechanism within the structure.